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Texas Instruments Incorporated
Data Acquisition
How the voltage reference affects
ADC performance, Part 2
By Miro Oljaca, Senior Applications Engineer,
and Bonnie Baker, Senior Applications Engineer
Introduction
This article is Part 2 of a three-part series that investigates
the design and performance of a voltage-reference system
for a successive-approximation register (SAR) analog-to-
digital converter (ADC). A simplified version of this system
is shown in Figure 1. When a design uses an ADC in this
system, it is critical to understand the voltage-reference
path to the converter. Part 1 (see Reference 1) examined
the fundamental operation of an ADC independent of the
voltage reference, and then analyzed the performance
characteristics that have an impact on the accuracy and
repeatability of the system. Part 2 looks at the key charac-
teristics of the voltage-reference block in Figure 1 and the
reference’s possible impact on the ADC’s performance.
Part 2 also shows how to design an appropriate external
reference for 8- to 14-bit ADCs. Part 3, which will appear
in a future issue of the Analog Applications Journal , will
investigate the impact of the voltage-reference buffer and
the capacitors that follow it, discuss how to ensure that the
amplifier is stable, and provide a reference design that is
appropriate for ADCs with 16+ bits.
Choosing the correct V REF topology
Voltage references are available in two-terminal shunt or
three-terminal series configurations (see Figure 2). Figure
2a shows a two-terminal shunt voltage reference, in which
the entire IC chip of
the shunt reference
operates in parallel to
its load. With a shunt
voltage reference, an
input voltage is
applied to the resistor
that is connected to
the cathode. The
typical initial voltage
accuracy of this
device can be as low
as 0.5% or range up
to 5%, with a temper-
ature coefficient of
approximately 50 to
100 µV/°C. The shunt
voltage reference can
be used to create
positive, negative, or
floating reference
voltages.
Figure 1. Voltage-reference system for SAR ADC
V IN
Voltage
Reference
V REF
D OUT
AIN
ADC
The three-terminal series voltage reference (Figure 2b)
operates in series with its load. An internal bandgap volt-
age, in combination with an internal amplifier, creates the
output voltage of this reference. The series voltage refer-
ence produces an output voltage between the output and
ground while providing the appropriate output current to
Figure 2. Voltage-reference configurations
V IN
V IN
Cathode
Output
Amplifier
V OUT
Ref
+
1.2 V
Load
+
Load
+
Bandgap
V REF
Series
Reference
Shunt
Reference
Anode
(a) Two-terminal shunt
(b) Three-terminal series
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3Q 2009
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Data Acquisition
Texas Instruments Incorporated
the external load. As the load current increases or
decreases, the series reference maintains the voltage
at V OUT .
The typical initial voltage accuracy of a series-reference
device can be as low as 0.05% or range up to 0.5%, with
temperature coefficients as low as 2.5 ppm/°C. Because
of the series reference’s superior initial output voltage and
overtemperature performance, this type of device would
be used to drive the reference pins of precision ADCs.
Beyond 8 or 14 resolution bits, where the size of the least
significant bit (LSB) is respectively 0.4% and 0.006%, an
external series voltage reference ensures that the intended
precision of the converter can be achieved.
Another common application for series voltage refer-
ences is sensor conditioning. In particular, a series voltage
reference is useful in bridge-sensor applications as well as
applications that have thermocouples, thermopiles, and
pH sensors.
The initial accuracy of the series voltage reference in an
ADC application (as in Figure 1) provides the general ref-
erence for the conversion process. Any initial inaccuracy of
the output voltage can be calibrated in hardware or soft-
ware. Additionally, changes in the accuracy of the voltage-
reference output can be a consequence
of the temperature coefficient, the line
regulation, the load regulation, or long-
term drift. The series voltage reference
provides better performance in all of
these categories.
Understanding reference-
voltage noise
From Part 1 of this series it can be con-
cluded that the ADC has only one func-
tion. That function is to compare an input
voltage to a reference voltage, or to create
an output code based on an input signal
and reference voltage. Part 1 presented
diagrams and formulas that describe the
basic transfer function of the ADC along
with the device’s noise characteristics. The
typical transfer function of an ideal ADC,
shown here in Figure 3, was described as
Figure 3. An ideal, 3-bit ADC transfer function
111
110
101
100
011
010
001
000
Full-Scale Range
AIN
Negative
Full Scale
Positive
Full Scale
Figure 4. Total noise at ADC output as a function of ADC
input voltage
50
45
40
35
30
25
20
15
10
5
0
ADC + Reference Noise
Reference
Noise
ADC Internal Noise
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
AIN
n
2
Code
V
,
(1)
IN
V
REF
where “Code” is the ADC output code in decimal form, V IN
is the analog input voltage to the ADC, n is the number of
ADC output bits, and V REF is the analog value of the ref-
erence voltage to the ADC. This formula shows that any
initial error or noise in the reference voltage translates to
a gain error in the code output of the ADC.
If several points from the ADC’s negative full-scale input
to its positive full-scale input are measured, it becomes
clear that the contribution of the reference noise is a func-
tion of the ADC input voltage. To evaluate the voltage-
reference noise as well as the overall noise, it is necessary
to measure the noise close to both the negative full scale
and the positive full scale. Figure 4 shows the results of
measuring the reference noise and the ADC noise in a
system. These results show that the overall noise is not
constant but linearly dependent on the ADC’s analog input
voltage. When this type of system is designed, it is impor-
tant to keep the reference noise lower than the ADC’s
internal noise.
Both reference topologies in Figure 2 generate compa-
rable noise over frequency. The voltage noise in series
voltage references comes mainly from the bandgap and
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Texas Instruments Incorporated
Data Acquisition
the output amplifier. Both of these elements gener-
ate noise in the 1/f region and the broadband region
(see Figure 5).
Noise in the voltage reference’s 1/f region
In the data sheets of most series-reference devices,
the specification for output-voltage noise is over the
frequency range of 0.1 to 10 Hz, which encompasses
the 1/f region in Figure 5. Noise in the 1/f region,
often called “pink noise,” is replaced in the higher
frequency domain by the broadband noise.
Noise in the voltage reference’s broadband region
Some manufacturers include specifications for the
voltage reference’s output noise density. This type of
specification is usually for noise in the broadband
region, such as the noise density at 10 kHz. Broad-
band noise, which is present over the higher wide-
band frequencies, is also known as “white noise” or
“thermal noise.”
An added low-pass filter with an extremely low
corner frequency will reduce the broadband noise at the
output of the reference. This filter is designed with a
capacitor, the equivalent series resistance (ESR) of the
capacitor, and the open-loop output impedance of the
reference output amplifier (see Figure 6).
Table 1 shows the noise measured from the Texas
Instruments REF5040 for different frequency bandwidths
as well as for different external-capacitor values and
types. These measurements demonstrate that ceramic
capacitors with a low ESR of about 0.1 Ω have a tendency
to increase noise compared to tantalum capacitors with a
standard ESR of about 1.5 Ω. This tendency is the result of
stability problems and the gain peaking of the reference’s
output amplifier.
As mentioned earlier, the two sources of noise in the
reference voltage are the internal output amplifier and
the bandgap. The internal schematic of the REF5040 in
Figure 7 shows that the TRIM pin provides direct access
to the bandgap. An external capacitor can be added to the
TRIM pin to create a low-pass filter. This filter provides a
Figure 5. Example voltage-noise regions in the
frequency domain
100
1/f
Region
Broadband
Region
10
Low-Pass
Filter
1
1
10
100
1000
10000
Frequency (Hz)
Figure 6. Low-pass filter between series
voltage reference and ADC
V IN
Voltage
Reference
Output
Amplifier
R O
Bandgap
Reference
V OUT
+
ESR
C L1
V REF
D OUT
AIN
ADC
Figure 7. Using TRIM pin to filter REF5040
bandgap noise
Table 1. Noise measured from REF5040 for different bandwidths
and capacitor values and types
MEASURED NOISE (µV RMS )
FOR FOUR BANDWIDTHS
REF5040
CAPACITOR
22 kHz
(Low-Pass
5-Pole)
30 kHz
(Low-Pass
3-Pole)
80 kHz
(Low-Pass
3-Pole)
>500 kHz
GND
0.8
1
1.8
4.9
V OUT
10 k
1 µF (tantalum)
37.8
41.7
53.7
9017
1.2 V
+
+
2.2 µF (ceramic)
41.7
46.2
55.1
60.8
TRIM
10 µF (tantalum)
33.4
33.4
35.2
38.5
1 k
10 µF (ceramic)
37.1
37.2
37.8
39.1
1 µF
20 µF (ceramic)
33.1
33.1
33.2
34.5
47 µF (tantalum)
23.2
23.8
24.1
26.5
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Data Acquisition
Texas Instruments Incorporated
bandgap broadband attenuation of approximately –21 dB.
For example, a small 1-µF capacitor adds a pole at 14.5 Hz
and a zero at 160 Hz. If more filtering is needed, a larger-
value capacitor can be used in place of the 1-µF capacitor.
For instance, a 10-µF capacitor will generate a 3-dB corner
frequency of 1.45 Hz. This low-pass filter will lower the
bandgap noise. Attaching a 1-µF capacitor to the TRIM pin
of the REF5040 will lower the total output RMS noise by a
factor of 2.5.
Conclusion
Figure 8 shows a complete circuit diagram for a reference
system configured with an 8- to 14-bit converter. The accu-
racy of the voltage reference in this system is important;
however, any initial inaccuracy can be calibrated with
hardwareorsoftware.Ontheotherhand,eliminatingor
reducing reference noise will require a degree of charac-
terization and hardware-filtering techniques. Part 3 of this
article series will explore the proper filtering for the
broadband region.
Part 3 will also investigate and explain how to design a
reference circuit that is appropriate for converters with
16+ bits. The impact of the voltage-reference buffer and
its following amplifier/resistor/capacitor network will be
analyzed. With the measurements that follow the final sys-
tem tuning, the assumptions and conclusions of this article
series will be compared to the real world.
References
For more information related to this article, you can down-
load an Acrobat ® Reader ® file at www-s.ti.com/sc/techlit/
litnumber and replace “ litnumber ” with the TI Lit. # for
the materials listed below.
Document Title
TI Lit. #
1.BonnieBakerandMiroOljaca,“Howthe
Voltage Reference Affects ADC Performance,
Part 1,” Analog Applications Journal
(2Q 2009) ............................... slyt331
2. Bonnie Baker, “A Glossary of Analog-to-
Digital Specifications and Performance
Characteristics,” Application Report ......... sbaa147
3.TimGreen.Operationalamplifierstability,
Parts 3, 6, and 7. EN-Genius Network:
analogZONE: acquisitionZONE [Online].
Available: http://www.analogzone.com/
acqt 0000 .pdf (Replace “ 0000 ” with “0307 ” for
Part 3, “0704 ” for Part 6, or “0529” for Part 7.)
4.BonnieC.BakerandMiroOljaca.(2007,
June 7). External components improve
SAR-ADC accuracy. EDN [Online].Available:
5.Wm.P.(Bill)Klein,MiroOljaca,andPete
Goad. (2007). Improved voltage reference
circuits maximize converter performance.
AnalogeLab™Webinar[Online].Available:
“Videos” under “Analog eLab™ Design
Support” and select webinar title.)
Figure 8. Voltage-reference circuit for 8- to
14-bit converters
6. Art Kay. Analysis and measurement of
intrinsic noise in op amp circuits, Part I.
EN-Genius Network: analogZONE:
audiovideoZONE [Online].Available:
V IN
Voltage
Reference
R O
10 k
Bandgap
Reference
V OUT
+
10 µF
( Tantalum )
1 k
TRIM
1µF
V REF
D OUT
AIN
ADC
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